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AssigneeHitachi, Ltd.
InventorsHiroki FUNATO, Takashi Suga, Kouichi Uesaka
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A magnetic field probe apparatus includes a loop-like conductor and feeder lines spaced at a distance from the loop-like conductor. The shape of the loop-like conductor and the arrangement of the feeder lines are adjusted in such a manner that the resonance frequency determined by the combination of the inductance of the loop-like conductor line and the capacitance formed between the looped-conductor and the feeder lines, is matched to the frequency of the magnetic field generated by and in the vicinity of a measurement object (e.g. electronic device) or the frequency of the electric signal which generates the magnetic field. With the magnetic field probe apparatus according to this invention, the magnetic field in the vicinity of the measurement object can be measured with high sensitivity.
A magnetic field probe apparatus comprising a probe element for detecting the magnetic field generated by a measurement object;
A method for measuring the spatial distribution of the intensity and orientation of the magnetic field generated by a measurement object on the basis of the voltage or current generated in a probe element placed in the vicinity of the measurement object so as to interact with the magnetic field, wherein a series resonance circuit consisting of at least one inductance and at least one capacitance is formed with at least one conductor line and a pair of transmission lines included in the probe element, the pair of transmission lines being connected with each other via a load element across which a voltage is developed or in which a current is induced;
Dependencies are inferred from the claim text.