Pixel structure and methods for fabricating, detecting, and repairing the pixel structure
AssigneeAu Optronics Corporation
InventorsYu-Hsin Lin, Chung-Chih Cheng
Life of this patent
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Abstract
A pixel structure comprises at least two scan and data lines. The scan and data lines substantially intersects one another to form at least one region therein. The pixel structure further comprises at least one thin film transistor, at least one passivation layer, at least one defect detection pattern, and at least one pixel electrode. The pixel electrode is disposed on the passivation layer and electrically connected to the thin film transistor via an opening of the passivation layer. The defect detection pattern is disposed in the region to detect whether any residue remains therebelow.
Claims28
A pixel structure, comprising:
- at least two scan lines formed on a substrate;
- at least two data lines formed on the substrate and substantially intersected the scan lines, respectively, so as to form at least one region;
- at least one thin film transistor disposed in the region and electrically connected to one of the scan lines and one of the data lines;
- at least one passivation layer disposed on the substrate and covering the scan lines, the data lines, and the thin film filter, and having at least one opening;
- at least one defect detection pattern disposed in the region so as to detect whether any residue is remained therebelow;
- and
- at least one pixel electrode disposed on the passivation layer and electrically connected to the thin film transistor via the opening.
A method for manufacturing a pixel structure, comprising:
- forming at least two scan lines on a substrate;
- forming at least two data lines on the substrate and substantially intersecting to the scan lines so as to form at least one region;
- forming at least one thin film transistor in the at least one region and electrically connected to one of the scan lines and one of the data lines;
- forming at least one passivation layer on the substrate, so that the passivation layer has at least one opening and covers the scan lines, the data lines, and the at least one thin film transistor;
- forming at least one defect detection pattern in the at least one region for inspecting whether any residue remains therebelow;
- and
- forming at least one pixel electrode on the at least one passivation layer and electrically connected to the at least one thin film transistor via the at least one opening.
Dependencies are inferred from the claim text.