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US 2007/0176807 A1Published application
Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit
AssigneeInfineon Technologies AG
InventorsHeinz Mattes, Sebastian Sattler
Life of this patent
Estimating the term…
Abstract
The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE1).
Claims20
An electronic test circuit for an integrated circuit to be tested, the electronic test circuit comprising:
- an input for receiving an analog data stream,
- a programmable digital line emulator for emulating properties of a transmission path,
- an output for emitting an analog data stream having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator, the input and output being selectively connected or being able to be selectively connected to an output and an input, respectively, of a transmitter/receiver for test purposes.
An electronic test circuit for a transceiver to be tested, the transceiver comprising:
- an input for receiving an analog data stream,
- a programmable digital line emulator for emulating properties of a transmission path,
- an output for emitting an analog data stream having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator, the input and output being selectively connected or being able to be selectively connected to an output and an input, respectively, of a transmitter/receiver for test purposes.
Dependencies are inferred from the claim text.