Test Handler and Loading Method Thereof
AssigneeTechwing Co., Ltd.
InventorsJae-Gyun SHIM, Yun-Sung NA, In-Gu JEON, Tae-Hung KU, Hyun-Jun YOO
Life of this patent
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Abstract
When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.
Claims13
A test handler, comprising:
- a loading unit for loading semiconductor devices of user trays onto a test tray;
- a test chamber in which a tester tests the semiconductor devices loaded on the test tray by the loading unit;
- and
- an unloading unit for unloading the semiconductor devices tested in the test chamber from the test tray onto user trays,
- wherein the loading unit includes:
- at least one moving type loading table movable between a first region and a second region, and having device-settling cells arranged to have a pitch wider in at least one direction than a pitch between the semiconductor devices loaded on the user trays;
- a first picking apparatus movable in the first region to transfer and load the semiconductor devices from the user trays to the device-settling cells of the moving type loading table positioned in the first region;
- and
- a second picking apparatus movable in the second region to transfer and load the semiconductor devices from the device-settling cells of the moving type loading table positioned in the second region to the test tray.
A test handler, comprising:
- a loading unit for loading semiconductor devices of user trays onto a test tray;
- a test chamber in which a tester tests the semiconductor devices loaded on the test tray by the loading unit;
- and
- an unloading unit for unloading the semiconductor devices tested in the test chamber from the test tray onto user trays,
- wherein the loading unit includes:
- at least one moving type loading table movable between a first loading position and a second loading position;
- a first picking apparatus for adjusting a front/rear pitch between the semiconductor devices in transferring and loading the semiconductor devices from the user trays onto the moving type loading table positioned in the first loading position;
- and
- a second picking apparatus for transferring and loading the semiconductor devices from the moving type loading table positioned in the second loading position onto the test tray.
A test handler, comprising:
- a loading unit for loading semiconductor devices of user trays onto a test tray;
- a test chamber in which a tester tests the semiconductor devices loaded on the test tray by the loading unit;
- and
- an unloading unit for unloading the semiconductor devices tested in the test chamber from the test tray onto user trays,
- wherein the loading unit includes:
- at least one moving type loading table movable between a first loading position and a second loading position;
- a first picking apparatus for adjusting a right/left pitch between the semiconductor devices in transferring and loading the semiconductor devices from the user trays onto the moving type loading table positioned in the first loading position;
- and
- a second picking apparatus for transferring and loading the semiconductor devices from the moving type loading table positioned in the second loading position onto the test tray.
A method of loading semiconductor devices of user trays onto a test tray in a test handler, comprising the steps of:
- adjusting a front/rear pitch between the semiconductor devices;
- adjusting a right/left pitch between the semiconductor devices;
- and
- loading the semiconductor devices onto the test tray.
A method of loading semiconductor devices of user trays onto a test tray in a test handler, comprising the steps of:
- adjusting a right/left pitch between the semiconductor devices;
- adjusting a front/rear pitch between the semiconductor devices;
- and
- loading the semiconductor devices onto the test tray.
Dependencies are inferred from the claim text.