Temperature compensation circuit and testing apparatus
AssigneeAdvantest Corporation
InventorsYuji Kuwana, Yoshiharu Umemura, Takashi Sekino
Life of this patent
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Abstract
A temperature compensation circuit for effectively compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit is provided. The temperature compensation circuit includes a temperature detecting section for detecting a value corresponding to the temperature of the switching element, and a correction section for correcting the voltage of a logic signal inputted from a previous circuit to the logic circuit in order to reduce the difference of the switching timing due to the temperature change of the switching element based on the value corresponding to the temperature.
Claims8
A temperature compensation circuit for compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit, comprising:
- a temperature detecting section for detecting a value corresponding to the temperature of the switching element;
- and
- a correction section for correcting the voltage of a logic signal inputted from a previous circuit to the logic circuit in order to reduce the difference of the switching timing due to the temperature change of the switching element based on the value corresponding to the temperature.
A testing apparatus for testing a device under test, comprising:
- a test signal generating section for generating a test signal to be provided to the device under test;
- a determining section for determining pass/fall of the device under test based on an output signal outputted by the device under test according to the test signal;
- and
- a temperature compensation circuit for compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit in the testing apparatus, wherein
- the temperature compensation circuit including:
- a temperature detecting section for detecting a value corresponding to the temperature of the switching element;
- and
- a correction section for correcting a voltage of a logic signal inputted from a previous circuit to the logic circuit in order to reduce the difference of a switching timing due to the temperature change of the switching element based on
- the value corresponding to the temperature.
Dependencies are inferred from the claim text.