Simulation of magnetic field induced vibrations in implantable medical devices
AssigneeMedtronic, Inc.
InventorsKateri Garcia, Robert Hiller, Troy Jenison, Bijoyendra Nath, James Neville, Craig Wiklund
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Abstract
A mechanical response of an implantable medical device (IMD) to a first static magnetic field and a first gradient magnetic field slew rate is simulated by exposing the IMD to a second static magnetic field having a magnitude greater than the first static magnetic field and generating a second gradient magnetic field at the IMD such that a product of the second static magnetic field and a second gradient magnetic field slew rate is substantially equal to a product of the first static magnetic field and the first gradient magnetic field slew rate.
Claims20
A method for simulating a mechanical response of an implantable medical device (IMD) to a first static magnetic field and a first gradient magnetic field slew rate, the method comprising:
- exposing the IMD to a second static magnetic field having a magnitude greater than the first static magnetic field;
- and
- generating a second gradient magnetic field at the IMD, wherein a product of the second static magnetic field and a second gradient magnetic field slew rate is substantially equal to or greater than a product of the first static magnetic field and the first gradient magnetic field slew rate.
A method for testing a vibration response of an implantable medical device (IMD) to a first static magnetic field and a first gradient magnetic field slew rate, the method comprising:
- simulating the vibration response by disposing the IMD in a second static magnetic field having a magnitude greater than the first static magnetic field and generating a second gradient magnetic field at the IMD such that a product of the second static magnetic field and a second gradient magnetic field slew rate is substantially equal to or greater than a product of the first static magnetic field and the first gradient magnetic field slew rate;
- and
- sensing the vibration response of the IMD to the second static magnetic field and the second gradient magnetic field.
A method for testing a reliability of a plurality of implantable medical devices (IMDs) in a magnetic resonance imaging (MRI) scanner that generates a first static magnetic field and a first gradient magnetic field, the method comprising:
- exposing an IMD in a second static magnetic field having a magnitude greater than the first static magnetic field;
- generating a second gradient magnetic field at the IMD, wherein a product of the second static and gradient magnetic fields is substantially equal to or greater than a product of the first static and gradient magnetic fields;
- characterizing a mechanical response of the IMD to the second static magnetic field and the second gradient magnetic field;
- and
- reproducing the characterized mechanical response on the plurality of IMDs.
Dependencies are inferred from the claim text.