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US 2007/0175284 A1Published application
Autoanalyzer and probe cleaning method
AssigneesKabushiki Kaisha Toshiba, Toshiba Medical Systems Corporation
InventorsTakehiko Oonuma, Hiroko Takayama
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Abstract
A specimen is sequentially sampled by a probe, and at least one of the number of times of cleaning and a cleaning time when cleaning the probe is changed based on at least one of the number of times of sampling of the specimen by the probe and a sampling amount of the specimen.
Claims17
An autoanalyzer comprising:
- a probe that samples a specimen;
- an analysis unit that analyzes the specimen sampled by the probe;
- a cleaning mechanism that cleans the probe;
- and
- a probe cleaning change section that changes at least one of the number of times of cleaning and a cleaning time of the probe by the cleaning mechanism based on at least one of the number of times of sampling of the specimen and a sampling amount of the specimen by the probe.
2 more elements
A probe cleaning method comprising:
- sequentially sampling a specimen by a probe;
- and
- changing at least one of the number of times of cleaning and a cleaning time when cleaning the probe based on at least one of the number of times of sampling of the specimen by the probe and a sampling amount of the specimen.
Dependencies are inferred from the claim text.