Fully-buffered dual in-line memory module with fault correction
AssigneeMarvell World Trade Ltd.
InventorsSehat Sutardja, Saeed Azimi
Life of this patent
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Abstract
A memory module comprises first memory that includes memory blocks, second memory, and non-volatile memory. A control module, during testing of at least one of the memory blocks having a first address, stores data from the at least one of the memory blocks in the second memory at a second address and stores the first and second addresses in the non-volatile memory. Content addressable memory (CAM) stores addresses of defective memory locations in the first memory and stores and retrieves data for the defective memory locations.
Claims40
A memory module comprising:
- first memory that includes memory blocks;
- second memory;
- non-volatile memory;
- a control module that, during testing of at least one of said memory blocks having a first address, stores data from said at least one of said memory blocks in said second memory at a second address and stores said first and second addresses in said non-volatile memory;
- and
- content addressable memory (CAM) that stores addresses of defective memory locations in said first memory and stores and retrieves data for said defective memory locations.
A method for operating a memory module comprising:
- providing a first memory that includes memory blocks, a second memory, and non-volatile memory;
- during testing of at least one of said memory blocks having a first address, storing data from said at least one of said memory blocks in said second memory at a second address and storing said first and second addresses in said non-volatile memory;
- storing addresses of defective memory locations in said first memory in content addressable memory (CAM);
- and
- storing and retrieving data for said defective memory locations from said CAM.
A memory module comprising:
- first storing means for storing data as memory blocks;
- second storing means for storing data;
- non-volatile storing means for storing data;
- control means for storing data from said at least one of said memory blocks in said first memory at a first address in said second storing means at a second address and for storing said first and second addresses in said non-volatile storing means during testing of at least one of said storing memory blocks having a first address;
- and
- content addressable storing means for storing addresses of defective memory locations in said first storing means and for storing and retrieving data for said defective memory locations.
Dependencies are inferred from the claim text.