Systems and methods for LBIST testing using commonly controlled LBIST satellites

Abstract

Systems and methods for performing logic built-in self-tests (LBISTs) in which an LBIST controller provides control signals to multiple LBIST satellites that are co-located with different functional blocks of the device under test, such as processor cores in a multiprocessor integrated circuit. Because the data paths for each satellite are shorter than data paths in conventional LBIST architectures, fewer latches are needed to synchronize the delivery of data to scan chains in the satellites. In one embodiment, each satellite includes a pseudorandom bit pattern generator (PRPG,) scan chains and a multiple-input signature register (MISR). In one embodiment, the LBIST circuitry also includes a control scan chain that is coupled to each of the LBIST satellites and configured to scan data into and out of the LBIST satellites.

Dependencies are inferred from the claim text.