Integrated circuit testing module including data compression
AssigneeInapac Technology, Inc.
InventorAdrian Ong
Life of this patent
Estimating the term…
Abstract
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment is configured to operate. In order to do so, the testing interface includes components configured for generating addresses and test data to be provided to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent.
Claims24
A system comprising:
- one or more data receiving components configured to receive data from an integrated circuit under test at a first clock frequency;
- a data compression component configured to compress the data received from the integrated circuit, to generate compressed data;
- at least one input configured for receiving expected data or a multiplexing scheme for use by the data compression component;
- and
- one or more data output components configured to convey the compressed data to automated testing equipment at a second clock frequency.
The system of claim 7, wherein the serial compression stage includes multiple comparisons of the data received from the integrated circuit to an expected data value.
A system comprising:
- one or more data receiving components configured to receive data from an integrated circuit under test;
- a data compression component configured to compress the data received from the integrated circuit to generate compressed data, the compression being responsive to an address within the integrated circuit from which the data was received;
- at least one input configured for receiving expected data or a multiplexing scheme for use by the data compression component;
- and
- one or more data output components configured to convey the compressed data to automated testing equipment.
A method comprising:
- attaching an integrated circuit to be tested to the test module;
- receiving data from the integrated circuit;
- compressing the received data responsive to expected data, to generate compressed data;
- and
- providing the compressed data to automated testing equipment.
Dependencies are inferred from the claim text.