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US 2007/0168805 A1Published application
Scan chain diagnostics using logic paths
AssigneeInternational Business Machines Corporation
InventorsLeendert Huisman, Leah Pastel
Life of this patent
Estimating the term…
Abstract
A structure and method for optimzing scan chain fail disgnosis. First, logic paths from target latches in a target scan chain to observation latches in at least one other observation scan chain are identified. Then, the locations of the observation latches within the other scan chains are optimized.
Claims16
A method of constructing scan chains to enable diagnosing failing scan chains, the method comprising the steps of:
- identifying simple logic paths from first target latches in a target scan chain to at least one other observation scan chain;
- and
- optimizing the locations of the first target latches in the target scan chain.
A method of constructing scan chains to enable diagnosing failing scan chains, the method comprising the steps of:
- identifying logic paths from target latches in a target scan chain to observation latches in at least one other observation scan chain;
- and
- optimizing the locations of the observation latches within the other scan chains.
Dependencies are inferred from the claim text.