Semiconductor integrated circuit with test circuit

A semiconductor integrated circuit comprising:

• a first logic section and a second logic section;
• a functional block connected between said first logic section and said second logic section;
• a scan path that includes, between an output of said first logic section and an input of said functional block, a parallel path and a serial shift path for serially transferring data, and that includes a plurality of first selectors for switching and connecting one of the output of said first logic section and said serial shift path to the input of said functional block, and a plurality of flip-flops for storing the data;
• and
• a plurality of second selectors connected into said serial shift path of said scan path, for switching and connecting one of an output of said functional block and said serial shift path to an input of said second logic section, wherein
• input data is provided from a control signal via said serial shift path of said scan path to said functional block.

A semiconductor integrated circuit comprising:

• a first logic section and a second logic section;
• a functional block connected between said first logic section and said second logic section;
• a scan path that includes, between an output of said first logic section and an input of said functional block, a parallel path and a serial shift path for serially transferring data, and that includes a plurality of first selectors for switching and connecting one of the output of said first logic section and said serial shift path to the input of said functional block, and a plurality of flip-flops for storing the data;
• and
• a plurality of second selectors connected into said serial shift path of said scan path, for switching and connecting one of an output of said functional block and said serial shift path to an input of said second logic section, wherein
• said second selectors output a signal that provides input data to said functional block by switching said first selectors, and said input data is provided from a control signal via said serial shift path of said scan path to said functional block.

A semiconductor integrated circuit comprising:

• a first logic section and a second logic section;
• a functional block connected between said first logic section and said second logic section;
• a scan path that includes, between an output of said first logic section and an input of said functional block, a parallel path and a serial shift path for serially transferring data, and that includes a plurality of first selectors for switching and connecting one of the output of said first logic section and said serial shift path to the input of said functional block, and a plurality of flip-flops for storing the data;
• and
• a plurality of second selectors connected into said serial shift path of said scan path, for switching and connecting one of an output of said functional block and said serial shift path to an input of said second logic section, wherein
• test data is provided from said serial shift path of said scan path to said functional block via said first selectors, and data output from said functional block is output via said second selectors after switching said second selectors.