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US 2007/0168775 A1Published application
Programmable Memory Test Controller
AssigneeTexas Instruments Incorporated
InventorsMukul TIKOTKAR, Anand BHAT
Life of this patent
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Abstract
Providing a programmable test controller integrated along with a random access memory (RAM). The programmable test controller can be programmed to test desired memory locations. Due to such a feature, the same design of the test controller can be integrated into several implementations (varying by design, fabrication parameters, design rules, etc.).
Claims17
A memory unit comprising:
- a random access memory (RAM) containing a plurality of locations;
- and
- a test controller comprising a first plurality of registers, wherein each of said plurality of registers is designed to be programmed to a corresponding one of a plurality of desired values, wherein the values in said plurality of registers determine the specific ones of said plurality of locations which are accessed for testing,
- whereby different locations of said RAM can be tested for different memory units by programming said first plurality of registers.
1 more element
Dependencies are inferred from the claim text.