Test method of embedded capacitor and test system thereof

A test system of embedded capacitor for testing a circuit board substrate having an embedded capacitor, comprising:

• a model database, for storing a standard electrical parameter and a relation value between an electrical parameter and an geometric size according to the type of a circuit board substrate;
• an image capturing module, for capturing an image of the circuit board substrate;
• an image analyzing unit, for analyzing the image to acquire a geometric size of the embedded capacitor;
• a searching module, for obtaining a relation value between an electrical parameter and the geometric size and the standard electrical parameter from the model database according to the type of the circuit board substrate being tested;
• a calculating module, for calculating an electrical parameter of the embedded capacitor with the geometric size and the relation value;
• a comparing module, for comparing the electrical parameter with the standard electrical parameter, thereby obtaining an error value;
• and
• a determining module, for determining the error value to generate a determination result indicating whether or not the circuit board substrate satisfies set electrical specifications.