Small electrode for resistance variable devices
AssigneeMicron Technology, Inc.
InventorsJun Liu, Terry Gilton, John Moore
Life of this patent
Estimating the term…
Abstract
A memory element comprising first and second electrodes is provided. The first electrode is tapered such that a first end of the first electrode is larger than a second end of the first electrode. A resistance variable material layer is located between the first and second electrodes, and the second end of the first electrode is in contact with the resistance variable material. Methods for forming the memory element are also provided.
Claims35
1-22. (canceled)
A method of forming a memory element, the method comprising:
- forming a first electrode such that a first end of the first electrode is larger than a second end of the first electrode;
- forming a second electrode;
- and
- forming a resistance variable material layer between the first and second electrodes, the second end of the first electrode being formed in contact with the resistance variable material.
A method of forming a memory element, the method comprising:
- forming a first insulating layer over a substrate;
- forming a mask over the first insulating layer;
- forming a first opening within the first insulating layer and the mask;
- widening a portion of the first opening within the first insulating layer to form a second opening;
- depositing a conductive material over the mask and through the first and second openings;
- rotating the substrate while depositing the conductive material, the conductive material being deposited in a single direction, such that the conductive material forms a cone-like structure on the substrate, the cone-like structure being a first electrode;
- removing a portion of the conductive material that is over the mask;
- removing the mask;
- forming a second insulating layer in the second opening;
- forming at least one layer of resistance variable material over the first and second insulating layers and electrically coupled to the first electrode;
- and
- forming a second electrode over the at least one layer of resistance variable material.
A method of forming a memory element, the method comprising:
- forming a first photoresist layer over a substrate;
- forming a second photoresist layer over the first photoresist layer;
- forming a first opening within the first photoresist layer;
- forming a second opening within the second photoresist layer, the second opening being larger than the first opening;
- depositing a conductive material over the mask and through the first and second openings;
- rotating the substrate while depositing the conductive material, the conductive material being deposited in a single direction, such that the conductive material forms a cone-like structure on the substrate, the cone-like structure being a first electrode;
- removing a portion of the conductive material over the second photoresist layer;
- removing the first and second photoresist layers;
- forming at least one layer of resistance variable material over and electrically coupled to the first electrode;
- and
- forming a second electrode over the at least one layer of resistance variable material.
Dependencies are inferred from the claim text.