Device and method for correcting defects in x-ray images
AssigneeKoninklijke Philips Electronic, N.V.
InventorsHanns-Ingo Maac, Andreas Kloessner
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Abstract
The invention relates to a method for correcting defects in X-ray images in which potentially defective picture elements (p) are identified in X-ray images (I), which are created during normal operation, by comparing the value (W(p)) of said picture elements with corresponding values in a neighborhood (n(p)). If a picture element (p) has been classified as “potentially defective” in more than a specified percentage of X-ray images, it is entered in a defect map which is refreshed on a continuous basis. The defect map can then be used to correct other X-ray images.
Claims13
A method for correcting defects in X-ray images (R) with the aid of a defect map (D), comprising the steps:
- a) classification of picture elements (p) on an X-ray image (I) which has been pre-corrected with the current defect map (D) as “potentially defective” if their value (W(p)) differs from the interval ([G_u, G_o]) of the picture element values in a neighborhood (n(p)) assigned to it by a specified degree, and the saving of the picture elements (p), thus classified in a candidate map (C_map);
- (b) refreshing the defect map (D) with all the picture elements (p) from the candidate map (C_map) which have been classified as “potentially defective” in several X-ray images (I) and which also fulfill other criteria, where appropriate;
- (c) correction of further X-ray images (R) with the aid of the refreshed defect map (D)).
Data-processing equipment to correct defects in X-ray images (R) with the aid of a defect map (D), wherein the data-processing equipment is equipped to perform the following steps:
- a) classification of picture elements (p) on an X-ray image (I) which has been pre-corrected with the current defect map (D) as “potentially defective” if their value (W(p)) differs from the interval ([G_u, G_o]) of the picture element values in a neighborhood (n(p)) assigned to it by a specified degree, and saving of the picture elements (p), thus classified in a candidate map (C_map);
- (b) refreshing the defect map (D) with all the picture elements (p) from the candidate map (C_map) which have been classified as “potentially defective” in several X-ray images a) and which also fulfill other criteria, where appropriate;
- (c) correction of further X-ray images (R) with the aid of the refreshed defect map (D).
Dependencies are inferred from the claim text.