Method and apparatus to adjust voltage for storage location reliability
AssigneeIntel Corporation
InventorMorgan Dempsey
Life of this patent
Estimating the term…
Abstract
According to embodiments of the present invention, an integrated circuit such as a processor includes a counter to count an actual number of unreliable storage locations in the processor cache, at least one register to store an acceptable number of unreliable storage locations for the cache, a detector to measure a thermal environment of the processor, and circuitry to raise an operating voltage of the processor if the actual number of unreliable storage locations exceeds the acceptable number of unreliable storage locations, and if the thermal environment is acceptable.
Claims20
A method, comprising:
- determining an actual number of unreliable storage locations for an integrated circuit;
- determining an acceptable number of unreliable storage locations for the integrated circuit;
- if the actual number of unreliable storage locations exceeds the acceptable number of unreliable storage locations, then raising an operating voltage of the integrated circuit.
An integrated circuit, comprising:
- a counter to count an actual number of unreliable storage locations for the integrated circuit;
- at least one register to store an acceptable number of unreliable storage locations for the integrated circuit;
- and
- circuitry to raise an operating voltage of the integrated circuit if the actual number of unreliable storage locations exceeds the acceptable number of unreliable storage locations.
A system, comprising:
- an integrated circuit having a counter to count an actual number of unreliable storage locations for an integrated circuit, at least one register to store an acceptable number of unreliable storage locations for the integrated circuit, and circuitry to raise an operating voltage of the integrated circuit if the actual number of unreliable storage locations exceeds the acceptable number of unreliable storage locations;
- and
- an audio controller coupled to the integrated circuit.
Dependencies are inferred from the claim text.