An asymmetrical random access memory cell (1) comprising at least two cross coupled inverters (2, 3), each having a node (22, 32) wherein each node is driven by a first and second bit-line (blt, blc) of a pair of complementary bit-lines, which are connected via at least a first and second pass-transistor (21, 31), wherein said cross coupled inverters (2, 3) have different switching thresholds providing asymmetrically physical behaviours, and that the first and second pass-transistors (21, 31) are driven by a first and second wordline (wl, wwl), wherein the first and second wordlines are individually controlled.