US 2007/0165243 A1 · Device for measuring 3d shape using irregular pattern and method for the same

Abstract

The present invention relates to a device and method for measuring a three-dimensional shape and, more particularly, to a measurement device and method in which a specific pattern is generated on the surface of an object to be measured, the object is photographed using a camera, and data on the 3-D shape are acquired from a photographed image, wherein an irregular pattern is employed, thus simplifying a process of measuring the 3-D shape. The present invention is suitable for the measurement of a moving object, the fabrication of the device can be easily performed, various pattern generation means can be utilized, and an inexpensive and popularized image camera can be used instead of an expensive industrial camera. The present invention can be applied to the fabrication of custom-made shoe soles and custom-made shoes and a medical field.

Claims12

Dependent claims

A device for measuring a three-dimensional (3-D) shape using an irregular pattern, comprising:

irregular pattern generation means for generating an irregular pattern on a surface of an object to be measured;
photographing means for acquiring an image of the object on which the irregular pattern is generated;
a control unit for controlling the photographing means;
and
an operation unit for generating data on the 3-D shape by processing the image of the object acquired by the photographing means;
wherein the irregular pattern included in the image is employed as a criterion for searching for correspondence with respect to the data on the 3-D shape while the photographed image of the object is processed into the data on the 3-D shape.

3 more elements

Dependencies are inferred from the claim text.

Device for measuring 3d shape using irregular pattern and method for the same

Life of this patent

Device for measuring 3d shape using irregular pattern and method for the same

Life of this patent

Abstract

Claims12