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US 2007/0164371 A1Published application
Reliability degradation compensation using body bias
OwnerJames Tschanz, Subhasish Mitra +1inventors
InventorsJames Tschanz, Subhasish Mitra, Vivek De
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Abstract
A system may include detection of reliability degradation of a transistor, and change of a body bias applied to the transistor based on the detected reliability degradation.
Claims19
A method comprising:
- detecting reliability degradation of a transistor;
- and
- changing a body bias applied to the transistor based on the detected reliability degradation.
An apparatus comprising:
- a reliability degradation detector to detect reliability degradation of a transistor;
- and
- a body bias control to change a body bias applied to the transistor based on the detected reliability degradation.
A system comprising:
- a microprocessor comprising:
- a transistor;
- a reliability degradation detector to detect reliability degradation of the transistor;
- and
- a body bias control to change a body bias applied to the transistor based on the detected reliability degradation;
- and
- a double data rate memory coupled to the microprocessor.
4 more elements
Dependencies are inferred from the claim text.