Method for scanner control in at least one scan axis in a laser scanning microscope
AssigneeCarl Zeiss MicroImaging GmbH
InventorJoerg Steinert
Life of this patent
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Abstract
Method for scanner control in at least one scan axis in a laser scanning microscope, the scan field being divided into partial area, a first image of at least one partial area produced by a forward scan being compared with a second image of the partial area produced by a back scan and a correction value for the scanner control determined from the deviation between the first and second image.
Claims17
(canceled)
The method according to claim 16, wherein in the step of subdividing the scan field, the scan field is divided into strips that form the partial regions.
Method according to claim 16, in which in the determining step, the correlation of partial images is determined for each scan axis.
Method according to claim 16, in which in the determining step, deviations are determined from the correlation of the partial images.
Method according to claim 16, further comprising the step of controlling or correcting the frequency of the scanner with the determined correction values.
Method according to claim 16, in which in the step of determining a correction value, a test pattern is used to determine the correction value.
A method for scanner control in at least one scan axis in a laser scanning microscope, comprising the steps of:
- subdividing the scan field into partial regions;
- generating a first partial image by a forward line scan of at least one partial region;
- generating a second partial image by a back line scan of the partial region;
- comparing the first partial image with the second partial image to determine a deviation between the first and second partial images;
- and
- determining a correction value for the scanner control from the deviation between the first and second partial images.
Dependencies are inferred from the claim text.