Apparatus for measuring uniformity of a laminar material

Abstract

There is described apparatus for measuring uniformity of a laminar material (1) as the material is delivered from a laminar material delivery machine (2), the apparatus has a measurement rig (10) arranged across the width of the laminar material. The measurement rig carries a linear array of light sources (21) arranged to direct light onto the laminar material (1), a linear array of optical sensors (20), each optical sensor (20) being paired with a light source (21) and being configured to receive light reflected by the laminar material (1) from at least the light source (21) with which it is paired and to thereafter produce a signal indicative of the amount of reflected light it receives, and a processor (11) for receiving signals from each of the optical sensors (20) and processing each of the signals to produce measures of uniformity of the linear material (1) for each optical sensor (20), whereby said apparatus produces measures of uniformity related to spaced apart locations across the width of the laminar material (1).

Dependencies are inferred from the claim text.