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US 2006/0242522 A1Published application
Test vehicle data analysis
AssigneeLSI Logic Corporation
InventorsRichard Schultz, Gerald Shipley, Derryl Allman
Life of this patent
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Abstract
A system and method for collecting and analyzing integrated circuit test vehicle test data by identifying various blocks of circuitry through at least two different intersecting test paths. In one embodiment, the process test circuits may be arranged in a matrix format and connected so that they may be tested along rows or columns. When a failure along a specific row and a specific column is identified, the process test circuit at the intersection may be identified as the failure point.
Claims17
A system comprising:
- an integrated circuit comprising:
- a plurality of process test circuits;
- at least one data collection circuit;
- and
- a control circuit capable of switching one or more of said plurality of process test circuits to connect to one of said at least one data collection circuit;
- a test device adapted to connect to at least one of said plurality of process test circuits, set said control circuits to one of said at least one data collection circuit, send signals through said process test circuits, and collect a plurality of sets of data using said at least one data collection circuit for more than one combination of said process test circuits and said data collection circuit;
- a test analyzer adapted to compare said sets of data, determine that a failure exists, and isolate said failure to one or more of said plurality of process test circuits, said data collection circuit, or said control circuit.
4 more elements
A method comprising:
- testing a first process test circuit and recording first data using a first data collection circuit;
- testing a second process test circuit and recording second data using said first data collection circuit;
- testing said first process test circuit and recording third data using a second data collection circuit;
- testing said second process test circuit and recording forth data using said second data collection circuit;
- and
- comparing said first data, said second data, said third data, and said fourth data to isolate a failure in one of said first process test circuit, said second process test circuit, said first data collection circuit, and said second data collection circuit;
- wherein said first process test circuit, said second process test circuit, said first data collection circuit, and said second data collection circuit are all embodied on a single integrated circuit.
4 more elements
Dependencies are inferred from the claim text.