Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
AssigneeInternational Business Machines Corporation
InventorsPatrick Meaney, Timothy McNamara, Bryan Mechtly
Life of this patent
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Abstract
An apparatus and method for allowing for dynamic wordline repair in a clock running system in addition to allowing for programmable fuse support of combined Array Built-In Self-Test (ABIST) and Logic Built-In Self-Test (LBIST) testing. The method makes use of programmable fuses which contain Level Sensitive Scan Design (LSSD) latches which also have a system port. The system port allows for simpler reading of the fuses as well as for the dynamic updates of the programmable fuses for wordline and other repairs.
Claims3
In an SMP computer system having an array, blowable fuses, and an apparatus for changing programmable fuses, the method of dynamically relocating an array comprising the steps of:
- (a) detecting an error in the array;
- (b) determining if the error is permanent;
- and
- (c) if error a permanent error, dynamically relocating the failing component of the array.
Dependencies are inferred from the claim text.