Simultaneous scan testing for identical modules
AssigneeTexas Instruments Incorporation
InventorsNeil Simpson, Divya Reddy, Hari Balachandran
Life of this patent
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Abstract
A system 100 for scan testing at least two substantially identical modules 140 and 150 within an integrated circuit is provided. The system 100 includes a first module 140 to receive and process scan input and produce a first scan output. The system 100 includes a second module 150 substantially similar to the first module 140. The second module 150 receives and processes scan input and produces a second scan output. The system 100 also includes a first component 180 to receive the first and second scan outputs and to produce a first output. The first output is used to determine whether the first and second modules 140 and 150 are functioning properly.
Claims20
A system for scan testing at least two substantially identical modules within an integrated circuit comprising:
- a first module operable to receive and process scan input and produce a first scan output;
- a second module substantially similar to the first module, the second module operable to receive and process scan input and produce a second scan output;
- and
- a first component operable to receive the first and second scan outputs and produce a first output, the first output used to determine whether the first and second modules are functioning properly.
A system for scan testing at least two substantially identical modules within an integrated circuit comprising:
- a scan input;
- a first module operable to receive and process the scan input and produce a first scan output;
- a second module substantially similar to the first module, the second module operable to receive and process the scan input and produce a second scan output;
- and
- a means for receiving the first and second scan outputs and producing a first output, the first output used to determine whether the first and second modules are functioning properly.
A method for determining whether at least two substantially identical modules within an integrated circuit are functioning properly, the method comprising:
- sending a scan input to a first module and a second module;
- producing a first scan output by the first module;
- producing a second scan output by the second module;
- sending the first and second scan outputs to a first component;
- producing a first output by the first component;
- and
- using the first output to determine whether the first and second modules are functioning properly.
Dependencies are inferred from the claim text.