Configurable automatic-test-equipment system
AssigneeTeradyne, Inc.
InventorToshihide Kadota
Life of this patent
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Abstract
Methods and systems for measuring a device under test are described. A first test instrument is connected to a programmable logic device. The programmable logic device is configured to comply with interface specifications of the first test instrument. A second test instrument, having interface specifications that are different from the interface specifications of the first test instrument, is connected to the programmable logic device. The programmable logic device is configured to comply with the interface specifications of the second test instrument.
Claims20
A method comprising:
- connecting a first test instrument to a programmable logic device;
- configuring the programmable logic device to comply with interface specifications of the first test instrument;
- connecting a second test instrument to the programmable logic device, the second test instrument having interface specifications that are different from the interface specifications of the first test instrument;
- and
- configuring the programmable logic device to comply with the interface specifications of the second test instrument.
A system comprising:
- a test instrument configured to measure one or more characteristics of a device under test;
- a host computer configured to receive test data collected from the test instrument and to control the operation of the test instrument;
- and
- a programmable logic device interfacing the test instrument and the host computer, the programmable logic device configured to transmit information between the test instrument and the host computer.
A system comprising:
- a programmable logic device configured to measure one or more characteristics of a device under test;
- and
- a host computer connected to the programmable logic device through an interface, the host computer configured to receive test data collected from the programmable logic device and to control the operation of the programmable logic device according to a measurement plan.
A computer program product being embodied in an information carrier, the computer program product comprising instructions that cause a computer to:
- connect a first test instrument to a programmable logic device;
- configure the programmable logic device to comply with interface specifications of the first test instrument;
- connect a second test instrument to the programmable logic device, the second test instrument having interface specifications that are different than the interface specifications of the first test instrument;
- and
- configure the programmable logic device to comply with the interface specifications of the second test instrument.
Dependencies are inferred from the claim text.