Memory application tester having vertically-mounted motherboard

A memory application tester for testing a semiconductor memory device using motherboards, the tester comprising:

• a plurality of the motherboards having a memory socket, the plurality of the motherboards being vertically mounted;
• an interface board disposed above the each of the motherboards, the interface board including a test socket disposed thereon for inserting the semiconductor memory device, and a high-speed connector disposed thereunder being electrically connected to the test socket;
• and
• a HiFix board disposed vertically to be in parallel to each of the motherboards, wherein the HiFix board includes a connector for connecting to the memory socket of the motherboard and a socket electrically connected to the connector, wherein the high-speed connector of the interface board is inserted in the socket.