Calibration apparatus and method using pulse for frequency, phase, and delay characteristic

A method for calibrating timing properties in an apparatus for measuring the properties of a device under test connected by a signal transmission path having reciprocity, said method comprising:

• connecting a resistance load to a terminal on the device under test side of the signal transmission path;
• transmitting reference signals to a terminal on the measuring apparatus side of the signal transmission path;
• monitoring and analyzing the spectrum of the transmitted reference signals on the measuring apparatus;
• monitoring and spectrum analyzing, on the measuring apparatus, the reference signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• referring to the spectrum of the transmitted reference signals and the spectrum of the reflected reference signals and finding the propagation delay of the signal transmission path.

A method for calibrating frequency properties in an apparatus for measuring the properties of a device under test connected by a signal transmission path having reciprocity, said method comprising:

• connecting a resistance load to a terminal on the device under test side of a signal transmission path;
• transmitting reference signals to a terminal on the measuring apparatus side of a signal transmission path;
• monitoring and spectrum analyzing, on the measuring apparatus, the reference signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• referring to the coefficient obtained based on the impedance of the resistance load and the spectrum of the reflected reference signals and finding the frequency properties of the signal transmission path.

A method for calibrating frequency properties in an apparatus for measuring the properties of a device under test connected by a signal transmission path having reciprocity, said method comprising:

• connecting a resistance load to a terminal on the device under test side of the signal transmission path;
• transmitting reference pulse signals to a terminal on the measuring apparatus side of the signal transmission path;
• monitoring and spectrum analyzing, on the measuring apparatus, the reference pulse signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• referring to the spectrum of the reflected reference signals and finding the relative propagation delay of the signal transmission path.

An apparatus for measuring the properties of a device under test connected by a signal transmission path having reciprocity, said apparatus comprising:

• a signal generator for transmitting reference signals to a terminal on the measuring apparatus side of a signal transmission path;
• a first analyzer that monitors the spectrum of the transmitted reference signals on the measuring apparatus;
• a second analyzer that monitors, on the side of the measuring apparatus, the reference signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• a processor for referring to the coefficient obtained based on the impedance of the resistance load connected to a terminal on the device under test side of the signal transmission path, the spectrum of the transmitted reference signals, and the spectrum of the reflected reference signals, and finding the frequency properties of the signal transmission path,
• wherein the measurement error attributed to the signal transmission path can be eliminated from the measurement results by referring to the frequency properties.

An apparatus for measuring the properties of a device under test connected by a signal transmission path having reciprocity, said apparatus comprising:

• a transmitter that transmits reference signals to a terminal on the measuring apparatus side of a signal transmission path;
• a first analyzer that monitors and analyzes the spectrum of the transmitted reference signals on the side of the measuring apparatus;
• a second analyzer that monitors and analyzes, on the side of the measuring apparatus, the reference signals reflected from a terminal on the device under test side of a signal transmission path;
• and
• a processor that refers to the spectrum of the transmitted reference signals, the spectrum of the reflected reference signals, and the coefficient obtained based on the impedance of the resistance load connected to a terminal on the device under test side of the signal transmission path, and finding the propagation delay of the signal transmission path,
• wherein the measurement error attributed to the signal transmission path can be eliminated from the measurement results by referring to the propagation delay.

An apparatus for measuring the properties of a device under test connected by a signal transmission path with reciprocity, said apparatus comprising:

• a transmitter that for transmits reference signals to a terminal on the measuring apparatus side of the signal transmission path;
• an analyzer that monitors and spectrum analyzes, on the side of the measuring apparatus, the reference signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• a process that refers to the coefficient obtained based on the impedance of the resistance load connected to a terminal on the device under test side of the signal transmission path and the spectrum of the reflected reference signals, and finding the frequency properties of the signal transmission path,
• wherein the measurement error attributed to the signal transmission path can be eliminated from the measurement results by referring to the frequency properties.

An apparatus for measuring the properties of a device under test connected by a signal transmission line having reciprocity, said apparatus comprising:

• a transmitter that transmits reference signals to a terminal on the measuring apparatus side of the signal transmission path;
• an analyzer that monitors and spectrum analyzes, on the side of the measuring apparatus, the reference signals reflected from a terminal on the device under test side of the signal transmission path;
• and
• a processor that refers to the spectrum of the reflected reference signals and finding the relative propagation delay of the signal transmission path.