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US 2006/0235291 A1Published application
Method for supporting an examination by means of an imaging diagnostic device
AssigneeSiemens Aktiengesellschaft
InventorsSultan Haider, Peter Kreisler
Life of this patent
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Abstract
With a method for supporting an examination by means of an imaging diagnostic device, at least one partial view of an examination object is generated and compared with a stored standard view. The result of the comparison is indicated to a user.
Claims10
-9. (canceled)
A method of supporting an examination using an imaging diagnostic device, comprising:
- selecting an examination mode of the imaging diagnostic device;
- generating an image having at least a partial view of an examination object using the imaging diagnostic device;
- comparing the image to a stored image having a reference view for determining if an accessory necessary for executing the examination mode is present, the reference view including the accessory;
- and
- displaying a result of the comparison.
2 more elements
Dependencies are inferred from the claim text.