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US 2006/0234637 A1Published application
Method and apparatus for measuring highly reflective channel performance
AssigneeIntel Corporation
InventorRichard Mellitz
Life of this patent
Estimating the term…
Abstract
A serial communications link includes a plurality of projections disposed on a reference channel. The projections may be disposed at predetermined angles relative to a signal propagation axis of the reference channel, and may be spaced to tune the reference channel to a predetermined jitter profile based on a data rate through the channel.
Claims29
A serial communications link, comprising:
- a reference channel having a signal propagation axis;
- and
- a plurality of projections disposed on the reference channel at predetermined angles relative to the signal propagation axis, wherein the projections are spaced to tune the reference channel to a predetermined jitter profile based on a data rate through the channel.
A serial communications link, comprising:
- a reference channel having a signal propagation axis;
- and
- a plurality of projections disposed on the reference channel at predetermined angles relative to the signal propagation axis, wherein the projections are sized to tune the reference channel to a predetermined jitter profile based on a data rate through the channel.
A method for controlling link performance, comprising:
- connecting a resonator in a reference channel, the resonator including a plurality of stubs which tune the reference channel to a predetermined jitter profile based on a data rate through the channel;
- and
- adjusting one or more parameters of the link to conform the link to the predetermined jitter profile.
A system, comprising:
- a chipset;
- and
- an interconnect, between the chipset and a circuit, having:
- a resonator in a reference channel and including a plurality of stubs which tune the reference channel to a predetermined jitter profile based on a data rate through the channel.
1 more element
Dependencies are inferred from the claim text.