Substrate processing apparatus and substrate processing method
OwnerMitsuhiko Shirakashi, Hozumi Yasuda +2inventors
InventorsMitsuhiko Shirakashi, Hozumi Yasuda, Masayuki Kumekawa, Itsuki Kobata
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OwnerMitsuhiko Shirakashi, Hozumi Yasuda +2inventors
InventorsMitsuhiko Shirakashi, Hozumi Yasuda, Masayuki Kumekawa, Itsuki Kobata
Estimating the term…
There is provided a substrate processing apparatus which can process a substrate by using an electrolytic processing method, while reducing a load upon a CMP processing to the least possible extent. The substrate processing apparatus of the present invention includes: an electrolytic processing unit (36) for electrolytically removing the surface of the substrate W having a to-be-processed film formed in said surface, said unit including a feeding section (373) that comes into contact with said surface of the substrate W; a bevel-etching unit (48) for etching away the to-be-processed film remaining unprocessed at the portion of the substrate that has been in contact with the feeding section (373) in the electrolytic processing unit (36); a chemical mechanical polishing unit (34) for chemically and mechanically polishing the surface of the substrate.
A substrate processing apparatus, comprising:
A substrate processing apparatus, comprising:
A substrate processing method, comprising:
A substrate processing method, comprising:
A substrate processing method, comprising:
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A semiconductor device comprising a substrate having fine trenches for interconnects formed in the surface, said fine trenches being filled with an interconnect material and with a protective film comprising a multi-layer laminated film formed on the surface of the interconnect material.
A substrate processing apparatus, comprising:
A substrate processing apparatus, comprising:
A substrate processing method, comprising;
A substrate processing method, comprising:
A substrate processing method, comprising:
Dependencies are inferred from the claim text.