Method and apparatus for processing a Bayer-pattern color digital image signal
AssigneeSamsung Electronics Co., Ltd.
InventorMing Zhao
Life of this patent
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Abstract
A method and apparatus for processing a Bayer-pattern color digital image signal are provided. The apparatus includes: a first defect detector generating first defect information of a first pixel to be processed from input image data; a second defect detector generating second defect information and horizontal and vertical gradients of the first pixel from the input image data; and a corrector compensating for a center-point defect, a thin line defect, or an edge defect in the first pixel according to the horizontal and vertical gradients using the first and second defect information to output corrected image data.
Claims25
A method of processing an image signal, comprising:
- generating first defect information of a first pixel to be processed from input image data;
- generating second defect information and horizontal and vertical gradients of the first pixel from the input image data;
- compensating for a center-point defect, a thin line defect, or an edge defect in the first pixel according to the horizontal and vertical gradients using the first and second defect information;
- and
- outputting corrected image data according to a result of the compensation.
An apparatus for processing an image signal, comprising:
- a first defect detector generating first defect information of a first pixel to be processed from input image data;
- a second defect detector generating second defect information and horizontal and vertical gradients of the first pixel from the input image data;
- and
- a corrector compensating for a center-point defect, a thin line defect, or an edge defect in the first pixel according to the horizontal and vertical gradients using the first and second defect information to output corrected image data.
Dependencies are inferred from the claim text.