Semiconductor memory device and testing method thereof
AssigneeElpida Memory, Inc.
InventorToru Ishikawa
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Abstract
A semiconductor memory device includes mini arrays and a serial-parallel conversion circuit. The serial-parallel conversion circuit simultaneously writes two continuous data into mutually different mini arrays out of plural data that are continuously input synchronously with an internal clock, and continuously outputs two data simultaneously read from different mini arrays, synchronously with the internal clock. In testing the semiconductor memory device according to the present invention, one data is written during a period when an external clock having a cycle of an integer times cycle of the internal clock is fixed to a high level or a low level. With this arrangement, continuous data can be assigned to mutually different mini arrays.
Claims17
A semiconductor memory device, comprising:
- a plurality of mini arrays;
- and
- a serial-parallel conversion circuit that supplies write data to the plurality of mini arrays and outputs read data supplied from the mini arrays,
- wherein said serial-parallel conversion circuit simultaneously supplies at least two continuous write data to different mini arrays that are continuously supplied from an outside synchronously with an internal clock, and continuously outputs at least two read data simultaneously supplied from different mini arrays, synchronously with the internal clock.
A testing method of a semiconductor memory device having a plurality of mini arrays and a serial-parallel conversion circuit that supplies write data to the plurality of mini arrays and outputs read data supplied from the mini arrays, the testing method comprising:
- a first step for simultaneously supplying at least two continuous write data to mutually different mini arrays out of a plurality of data that are continuously input synchronously with an internal clock;
- and
- a second step for continuously outputting at least two read data simultaneously supplied from different mini arrays, synchronously with the internal clock.
Dependencies are inferred from the claim text.