Sensor differentiated fault isolation

An apparatus for diagnostically testing circuitry within a device, having input pins and output pins, said apparatus comprising:

• a correlator;
• a tester operatively connected to said correlator and being adapted to input test pattern signals into said input pins, to monitor the pass/fail status of said device at said output pins, and to communicate a fail indication to said correlator, wherein said correlator is adapted to determine which circuitry within said device requires diagnositic testing based upon said fail indication;
• a stimulating energy source operatively connected to said correlator and being adapted to apply energy directly to any first location on said device such that electrical activity in said circuitry is affected producing an indicator of a response, and to communicate said first location to said correlator;
• and
• a sensor operatively connected to said correlator and located on said device at a second location, wherein said sensor is adapted to locally detect said indicator of said response within said circuitry without an electrical connection to any of said output ins, to process said indicator into indicator data, and to communicate said indicator data and said second location to said correlator;
• wherein said first location is independent of a location of any other structure connected to said device, and
• wherein said correlater comprises software that is adapted to correlate said first location with said second location in order to determine at least one of a location of said response within said circuitry and a connectivity of said circuitry, based on preset criteria and said indicator data.