Credential processing device event management
AssigneeFargo Electronics, Inc.
InventorGary Klinefelter
Life of this patent
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Abstract
In a method of monitoring a group of credential processing devices, credential substrates are processed using the credential processing devices of the group. Next, event outputs are received. Each event output relates to an occurrence of a process event during the processing of the substrate by one of the devices. Finally, a relative condition score is calculated for a subject device of the group based on the event outputs corresponding to the subject device and the event outputs corresponding to the other devices in the group. The relative condition score of the subject device is a measure of a condition of the subject device relative to the conditions of the other devices in the group. Also disclosed is a system configured to perform the above-described method.
Claims19
A method of monitoring a group of credential processing devices each configured to process credential substrates, the method comprising steps of:
- processing credential substrates using the credential processing devices of the group;
- receiving event outputs each relating to an occurrence of an event during the processing of the substrate by one of the devices;
- and
- calculating a relative condition score for a subject device of the group based on the event outputs corresponding to the subject device and the event outputs corresponding to the other devices in the group, wherein the relative condition score of the subject device is a measure of a condition of the subject device relative to conditions of the other devices in the group.
A credential production system comprising:
- a group of credential processing devices, each device configured to process a credential substrate;
- one or more event analyzers configured to produce event outputs each relating to an occurrence of an event during the processing of the substrate by the devices;
- and
- a device manager configured to calculate a relative condition score for a subject device of the group based on the event outputs corresponding to the subject device and the event outputs corresponding to the other devices in the group, wherein the relative condition score of the subject device is a measure of a condition of the subject device relative to conditions of the other devices in the group.
Dependencies are inferred from the claim text.