Antenna effect prevention by model extraction in a circuit design for advanced processes
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChung-Hsing Wang, Shou-Yi Lee, Lee-Chung Lu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChung-Hsing Wang, Shou-Yi Lee, Lee-Chung Lu
Estimating the term…
A method is disclosed for determining an antenna ratio for an interconnect in a circuit. The interconnect may be routed through one or more connection layers and may be electrically coupled to one or more gate oxide areas. A cumulative antenna ratio for all components on each connection layer is determined by considering an antenna effect caused by each component on a predetermined connection layer with regard to the gate oxide areas coupled thereto and any components on one or more connection layers coupled between the component of the present connection layer and the gate oxide areas. In the same fashion, a top layer cumulative antenna ratio for the interconnect is determined based on the cumulative antenna ratios for the connection layers below the top layer.
A method for determining an antenna ratio for an interconnect in a circuit, the interconnect being routed through one or more connection layers and being electrically coupled to one or more gate oxide areas, the method comprising:
A method for determining an antenna ratio for an interconnect in a circuit block, the interconnect being routed through one or more connection layers and being electrically coupled to one or more gate oxide areas, the method comprising:
A method for determining an antenna ratio for an interconnect in a circuit, the interconnect being routed through one or more connection layers and being electrically coupled to one or more gate oxide areas, the method comprising:
Dependencies are inferred from the claim text.