US 2006/0224658 A1 · Sample analyzing method and sample analyzing device

Abstract

This invention relates to a technique for analyzing a sample. A sample analyzer (1) provided by the invention includes: a voltage applier (12) for applying a voltage to a reaction field which includes a sample; a response measurer (13) for measurement of a response to the voltage applied to the reaction field; a selector (11) for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample; an arithmetic operator (17) for calculation necessary for analyzing the sample based on the first response; a determiner (17) for determination, based on the second response, on whether or not the reaction field has been supplied with the target amount of sample; and a controller (15) which makes the selector select the second voltage application state after making the selector select the first voltage application state.

Claims19

Dependent claims

A sample analyzing method based on a response obtained upon application of a voltage to a reaction field containing a sample, comprising:

a first step for measuring a first response for use in calculation necessary for analyzing the sample;
and
a second step performed later than the first step for measuring a second response necessary to determine whether a target amount of the sample has been supplied to the reaction field.

A sample analyzer comprising:

a voltage applier for application of a voltage to a reaction field including a sample;
a response measurer for measurement of a response to the voltage applied to the reaction field;
a selector for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample, or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample;
an arithmetic operator for calculation necessary for analyzing the sample based on the first response;
a determiner for determination based on the second response, on whether or not the reaction field has been supplied with the target amount of sample;
and
a controller for causing the selector to select the second voltage application state after causing the selector to select the first voltage application state.

4 more elements

Dependencies are inferred from the claim text.

Sample analyzing method and sample analyzing device

Life of this patent

Sample analyzing method and sample analyzing device

Life of this patent

Abstract

Claims19