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AssigneeGeneral Electric Company
InventorsSuneel Shankarappa, William McKnight, Vamshi Kommareddy, Ui Suh, Mandar Godbole, Anjani Schrad, Prafull Sharma
Estimating the term…
A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.
A method for generating a scanplan for inspection of a component, the method comprising:
A method of inspecting a component, the method comprising;
At least one computer-readable medium storing computer instructions for instructing a computer system for generating a scanplan for inspection of a component, the computer instructions comprising:
Dependencies are inferred from the claim text.