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US 2006/0224325 A1Published application
Predictive indicator model
AssigneeEthicon, Inc.
InventorsLea Conway, David Powell, Susanne Manz, Robert Smith, Mizanu Kebede
Life of this patent
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Abstract
A predictive indicator tool for predicting the risk of a manufacturing process producing products having defects. Manufacturing sub-processes are identified for the process and s a series of 12 questions is applied to each sub-process. The questions are generated using Six Sigma statistical techniques. The questions are scored and an associated algorithm is applied to produce a quantitative score is indicative of risk. The quantitative risk score is compared to an alert level.
Claims4
A predictive indicator tool, comprising:
- analyzing a product manufacturing process to determine each sub-process;
- providing the following 12 questions:
- 1—What is the Level of Patient Risk due to potential failure of this product?
- 2—What is the Level of Regulatory Risk related to this product or process?
- 3—Are product CTQs identified and linked to VOC?
- 4—Is a Product Risk Assessment complete and risk mitigation plan in place?
- 5—Have CTQs flowed down to component/RM level with control plans in place for each component/RM?
- 6—Do Sampling Plans/Control strategies utilize documented statistical rationales?
- 7—Does a Control Plan Exist and identify KPIVs and controls for each CTQ?
- 8—Is an Adequate Test Method control identified for each CTQ?
- 9—What is Critical Defect (3 month average) Process Capability in DPM or Ppk (complete roll-up)?
- 10—Is there an Effective Training Plan defined, followed, and up to date?
- 11—Are Manufacturing Methods and other procedures properly executed (# of human error deviations)?
- 12—Is Process FMEA complete and adequate?
- providing an algorithm and a scoring system for the 12 questions such that the cumulative total will be in the range of 0-100;
- applying each question to each manufacturing sub-process;
- scoring each question and determining a risk score for the process by using the following algorithm:
- PI=Severity*Detection*Occurrence/23328*100, wherein
- Severity=the sum of the scores of Questions 1 and 2,
- Occurrence=the sum of the scores of Questions 3, 4, 5, 7, 9, 10, 11 and 12.
- Detection=the sum of Questions 6 and 8;
- and,
- comparing the risk score to an appropriate alert level, and if the risk score is greater than the alert level, classifying the sub-process as requiring corrective action to eliminate the potential risk identified.
20 more elements
Dependencies are inferred from the claim text.