Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values
AssigneeNEC Electronics Corporation
InventorMasanobu Higashide
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AssigneeNEC Electronics Corporation
InventorMasanobu Higashide
Estimating the term…
In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive lower or upper tendency with respect to a control center value has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive lower or upper tendency has occurred and the at least one characteristic value is located within the control region outside the normal region, an alarm state is detected.
A method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, comprising:
A method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, comprising:
An apparatus for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, comprising:
An apparatus for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, comprising:
Dependencies are inferred from the claim text.