Method and apparatus for inspecting an object after stamping
AssigneesThe Chinese University of Hong Kong, Mansfield Manufacturing Co., Ltd.
InventorsRuxu Du, Maolin Yu, Yiu-Ming Ng, Wai To
Life of this patent
Estimating the term…
Abstract
A method and apparatus for inspecting an object after stamping is described. The method and apparatus comprises determining a temperature distribution of an object after stamping; obtaining one or more thermal images of the object after stamping; and comparing the determined temperature distribution with the obtained thermal images so as to identify defects existing in the object after stamping, in which the difference between the temperature distribution and the thermal images indicates the presence of defects in the object. The method and apparatus can therefore inspect and analysis problems of the object occurred during the stamping process.
Claims20
A method for inspecting an object after stamping, comprising:
- obtaining one or more thermal images of the object after stamping;
- and
- identifying defects existing in the object due to the stamping process by using the one or more thermal images,
- wherein a non-smooth temperature gradient in the one or more thermal images indicates that defects exist in the object during the stamping process.
A method for inspecting an object after stamping, comprising:
- determining a temperature distribution of an object after stamping;
- obtaining one or more thermal images of the object after stamping;
- and
- comparing the determined temperature distribution with the obtained thermal images so as to identify defects existing in the object after stamping,
- wherein the difference between the temperature distribution and the thermal images indicates the presence of defects in the object.
An apparatus for inspecting an object after stamping, which comprises:
- a device to obtain one or more thermal images of an object after stamping;
- a data processing device, which is electrically coupled to said device for obtaining thermal images of the object after stamping, for inspecting the object by observing a non-smooth temperature gradient in the thermal images.
An apparatus for inspecting an object after stamping, comprising:
- a device for determining temperature distribution of the object after stamping by using Finite Element Analysis;
- a device for obtaining one or more thermal images of an object after stamping;
- a data processing device, which is electrically coupled to said device for determining temperature distribution of the object after stamping and said device to obtain thermal images of the object after stamping, for inspecting the object by comparing the determined temperature distribution with the thermal images.
Dependencies are inferred from the claim text.