Circuit for detecting and measuring noise in semiconductor integrated circuit

Abstract

A noise measuring circuit and a noise measuring circuit of the present invention can figure out power supply noise waveforms, ground level noise waveforms, and a spatial distribution of noise occurring positions by being embedded into distributed arrangement positions in said semiconductor integrated circuit comprising plural circuit block for performing a digital signal processing, and the noise measuring circuit and the noise measuring circuit is manufactured by the manufacturing process of the CMOS semiconductor integrated circuit. The power supply noise measuring circuit and the ground level noise measuring circuit comprise a source follower, a select read out switch, and source-grounded amplifier. These noise measuring circuits can be configured by several (about 6) MOS transistors, so the layout for the measuring circuit can be small and be achieved by the same size as that of a standard cell type logic gate circuit. As for the output of the noise measuring circuits, the output current of said source-grounded amplifier is connected to the current bus line, the outputted current is amplified and the amplified current is read by driving the external resistance load circuit. Plural noise measuring circuits can be connected parallel to the current bus line, and the multiple points noise measuring in the main integrated circuit can be achieved by reading out the output current.

Dependencies are inferred from the claim text.