Manufacture defect analyzer with detecting function and inspecting method thereof
AssigneeASUSTeK COMPUTER INC.
InventorYuan-Chiang Lee
Life of this patent
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Abstract
A manufacture defect analyzer (MDA) with a detecting function and inspecting method thereof are provided. The manufacture defect analyzer with a detecting function is for checking a to-be-inspected circuit board comprising a socket. The socket has an upper cover. The manufacture defect analyzer comprises a carrier, a detecting apparatus and an analyzer. The carrier is for supporting the to-be-inspected circuit board. The detecting apparatus corresponds to the socket and is disposed on the carrier and detects whether the upper cover is open. If the upper cover is open, then an open signal is outputted. After receiving the open signal, the analyzer is electrically connected to the socket to check whether the socket has any manufacture defect or not.
Claims14
A manufacture defect analyzer for checking a to-be-inspected circuit board, wherein the to-be-inspected circuit board comprises a socket having an upper cover, the manufacture defect analyzer comprising:
- a carrier for supporting the to-be-inspected circuit board;
- a detecting apparatus for checking whether the upper cover is opened to a to-be-inspected position, and outputting an open signal if yes;
- and
- an analyzer;
- wherein, after receiving the open signal, the analyzer is driven to be electrically connected to the socket to check whether the socket has any manufacture defect or not.
An inspecting method for manufacture defect analyzer, the method comprises:
- placing a to-be-inspected circuit board into a manufacture defect analyzer, wherein the to-be-inspected circuit board comprises a socket having an upper cover;
- using a detecting apparatus to check whether the upper cover is opened to a to-be-inspected position or not, and outputting an open signal if yes;
- and
- receiving the open signal by an analyzer, and then driving the analyzer to check whether the socket has any manufacture defect or not.
Dependencies are inferred from the claim text.