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US 2006/0221337 A1Published application
Method for corrected spectrophotometer output for measurements on multiple substrates
AssigneeXerox Corporation
InventorsLalit Mestha, Miroslav Bartik
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Abstract
Small, fast, and inexpensive in-line spectrophotometers can produce in-line spectrums of a substrate before or after printing on the substrate. In-line spectrums are generally far less complete than a reference spectrum produced with a large, slow, and expensive reference spectrophotometer. An in-line spectrum can be mapped to a reference spectrum using a variety of known algorithms. However, the mapping is erroneous when the media substrate type changes. Reference transform matrices and in-line transform matrices can correct the erroneous mapping.
Claims20
A method comprising:
- obtaining a target in-line spectrum from a target substrate and identifying the substrate type of the target substrate;
- retrieving data from a storage device wherein the specific data retrieved is based on the substrate type of the target substrate;
- and
- producing a corrected spectrum from the retrieved data and the target in-line spectrum.
1 more element
A method comprising:
- obtaining a representative in-line spectrum and a representative reference spectrum from a representative substrate that is typical of a substrate type;
- using the in-line spectrum and reference spectrum to produce data for later use in producing a corrected spectrum;
- and
- storing the data in a storage device.
1 more element
A system comprising:
- a data storage device that holds data that is used to produce a corrected spectrum;
- a measurement device the produces an in-line spectrum;
- and
- a processor that uses the data retrieved from the storage device and the in-line spectrum to produce a corrected spectrum.
1 more element
Dependencies are inferred from the claim text.