Data input buffer in semiconductor device
AssigneeHynix Semiconductor Inc.
InventorsHee-Bok Kang, Jin-Hong Ahn
Life of this patent
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Abstract
A data input buffer in a semiconductor is capable of avoiding operation speed deterioration of the data input buffer due to the temperature condition or process characteristic. The data input buffer in a semiconductor device includes an input detecting unit for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage, a current driving capability adjusting unit for adjusting current driving capability of the input detecting unit based on at least one of temperature condition and process characteristic, and a buffering unit for buffering the output signal from the input detecting unit.
Claims18
A data input buffer in a semiconductor device, comprising:
- input detecting means for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage;
- current driving capability adjusting means for adjusting current driving capability of the input detecting means based on at least one of temperature condition and process characteristic;
- and
- buffering means for buffering the output signal from the input detecting means.
A data input buffer in a semiconductor device, comprising:
- input detecting means for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage;
- sensing means for sensing temperature condition or process characteristic;
- first current driving capability adjusting means for adjusting current amount flowing through a data input part of the input detecting means in response to sensing result of the sensing means;
- second current driving capability adjusting means for adjusting current amount flowing through a reference voltage input part of the input detecting means in response to sensing result of the sensing means;
- and
- buffering means for buffering the output signal from the input detecting means.
An data input buffer in a semiconductor device, comprising:
- input detecting means for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage;
- sensing means for sensing temperature condition and process characteristic;
- first current driving capability adjusting means for adjusting current amount flowing through a data input part of the input detecting means in response to sensing result of the sensing means;
- second current driving capability adjusting means for adjusting current amount flowing through a reference voltage input part of the input detecting means in response to sensing result of the sensing means;
- and
- buffering means for buffering the output signal from the input detecting means.
Dependencies are inferred from the claim text.