TEM sample holder and method of forming same

A method of preparing a sample for examination in a TEM, the method comprising:

• joining at least one probe tip to a TEM sample holder pre-form;
• forming a TEM sample holder from the probe tip and the TEM sample holder pre-form;
• and, thereafter,
• attaching a sample to the point of a probe tip.

A method of preparing a sample for examination in a TEM;

• the method comprising:
• providing a TEM sample holder pre-form;
• providing at least one probe tip;
• the probe tip having a point;
• embedding the probe tip in the TEM sample holder form;
• cutting off that portion of the probe tip outside the boundary of the TEM sample holder form;
• cutting the TEM sample holder free from the TEM sample holder pre-form;
• and,
• thereafter, attaching a sample to the probe-tip point.

A method of preparing a sample for examination in a TEM, the method comprising:

• providing a TEM sample holder pre-form;
• providing a probe tip;
• the probe tip having a point;
• forming a TEM sample holder from the probe-tip and the TEM sample holder pre-form outside a FIB;
• and, thereafter,
• excising a sample from a substrate inside the FIB;
• attaching the sample to the probe-tip point inside the FIB;
• removing the probe-tip point and the sample attached to it from the FIB.

A method of preparing a sample for examination in a TEM, the method comprising:

• providing at least one probe tip;
• the probe tip having a probe-tip point;
• joining the probe-tip to a TEM sample holder pre-form inside the FIB;
• forming a TEM sample holder from the probe-tip and the TEM sample holder pre-form inside the FIB vacuum chamber.
• excising a sample from a substrate inside a FIB;
• and,
• attaching the sample to the probe-tip point inside the FIB.