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AssigneeHitachi High-Technologies Corporation
InventorsTomohisa Ohtaki, Kenichi Hirane, Ryoichi Ishii, Haruhisa Takahata
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In an environmental scanning electron microscope in which differential pumping for maintaining the pressure ratio between an electron optical system and a specimen chamber at a predetermined value is effected and a probe electric current is conditioned to meet a predetermined or more value so as to permit observation of uncooked food and moist specimens in low vacuum, there are provided three stages of objective apertures used as apertures for an objective lens for an electron beam in the electron optical system and used also as orifices for differential pumping for maintaining the pressure ratio between the electron optical system and the specimen chamber at a predetermined value. Then, a deflection fulcrum of the electron beam in the electron optical system is set at a mid stage of the three-stage objective aperture.
An environmental scanning electron microscope comprising three stages of objective apertures used as apertures for an objective lens functioning to focus an electron beam emitted from an electron source and used also as orifices for differential pumping between an electron optical system and a specimen chamber, wherein a deflection fulcrum of the electron beam in the electron optical system is set substantially at a mid stage of said three-stage objective aperture.
An environmental scanning electron microscope comprising three stages of objective apertures used as apertures for an objective lens functioning to focus an electron beam emitted from an electron source and used also as orifices for differential pumping between an electron optical system and a specimen chamber, wherein a deflection fulcrum of the electron beam in the electron optical system and a lens principal plane of said objective lens are set substantially at a mid stage of said three-stage objective aperture.
Dependencies are inferred from the claim text.