Methods of depositing materials over semiconductor substrates
OwnerEric Blomiley, Nirmal Ramaswamy +3inventors
InventorsEric Blomiley, Nirmal Ramaswamy, Ross Dando, Joel Drewes, Danny Dynka
Life of this patent
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OwnerEric Blomiley, Nirmal Ramaswamy +3inventors
InventorsEric Blomiley, Nirmal Ramaswamy, Ross Dando, Joel Drewes, Danny Dynka
Estimating the term…
In one implementation, a substrate susceptor for receiving a semiconductor substrate for selective epitaxial silicon-comprising depositing thereon, where the depositing comprises measuring emissivity of the susceptor from at least one susceptor location in a non-contacting manner, includes a body having a front substrate receiving side, a back side, and a peripheral edge. At least one susceptor location from which emissivity is to be measured is received on at least one of the front substrate receiving side, the back side, and the edge. Such at least one susceptor location comprises an outermost surface comprising a material upon which selective epitaxial silicon will not deposit upon during selective epitaxial silicon depositing on a semiconductor substrate received by the susceptor for at least an initial thickness of epitaxial silicon depositing on said substrate. Other aspects and implementations are contemplated.
1-10. (canceled)
A method of depositing a material over a semiconductor substrate comprising:
A method of depositing a material over a semiconductor substrate comprising:
(canceled)
A method of depositing an elemental silicon-comprising material over a semiconductor substrate, comprising:
A method of selectively depositing an epitaxial silicon-comprising material over a semiconductor substrate, comprising:
(canceled)
A method of depositing material over a semiconductor substrate comprising:
A method of depositing material over a semiconductor substrate comprising:
(canceled)
A method of depositing material over a semiconductor substrate comprising:
(canceled)
A method of depositing material over a semiconductor substrate comprising:
Dependencies are inferred from the claim text.