Integrated circuit fabrication
AssigneeMicron Technology, Inc.
InventorsLuan Tran, John Lee, Zengtao Liu, Eric Freeman, Russell Nielsen
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AssigneeMicron Technology, Inc.
InventorsLuan Tran, John Lee, Zengtao Liu, Eric Freeman, Russell Nielsen
Estimating the term…
A method for defining patterns in an integrated circuit comprises defining a plurality of features in a first photoresist layer using photolithography over a first region of a substrate. The method further comprises using pitch multiplication to produce at least two features in a lower masking layer for each feature in the photoresist layer. The features in the lower masking layer include looped ends. The method further comprises covering with a second photoresist layer a second region of the substrate including the looped ends in the lower masking layer. The method further comprises etching a pattern of trenches in the substrate through the features in the lower masking layer without etching in the second region. The trenches have a trench width.
A method for defining patterns in an integrated circuit, the method comprising:
A method of making a plurality of conductive lines in an array, the method comprising:
A method of pitch multiplication for damascene features in an integrated circuit, the method comprising:
A method of forming integrated circuit components on a substrate, the method comprising:
51-67. (canceled)
A method of forming a memory device that includes an array region and a peripheral region, the method comprising:
Dependencies are inferred from the claim text.