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AssigneeAgilent Technologies, Inc.
InventorsGregory Lee, Robert Taber, Izhak Baharav
Estimating the term…
An inspection system uses microwave radiation to capture a microwave image of a transportable item. The system includes a transmit scanning panel including a transmit array of transmit antenna elements, each being programmable with a respective phase delay to direct a transmit beam of microwave radiation toward a target of the transportable item for transmission of the microwave radiation through the target. The system further includes a receive scanning panel including a receive array of receive antenna elements, each being programmable with a respective phase delay to receive a receive beam of microwave radiation from the target. A processor measures the amplitude and phase of the microwave radiation in the receive beam to determine a relative value of a pixel within the microwave image of the transportable item based on a reference value of the pixel.
A microwave inspection system for inspecting transportable items, comprising:
A method for inspection of transportable items, comprising:
Dependencies are inferred from the claim text.